SIMU is designed for semiconductor testing data on yield analysis and product characterization. It provides in-depth analysis for test items to address complicated issues, recording test data and provide multiple statistical graphs, and flexible customized reports to meet user’s need.
Web Based Architecture
The web-based architecture with friendly and flexible user interface and user experiences, which reduces training cost and increase operational effectiveness, will ensure smooth development and maintenance. It's also excellent on high volume of data presented immediately by our leading algorithm and architecture.
Lot Tracking
Track production resume to link WAT-CP-FT for data analysis, and provides brand new interface on WAT/CP/FT tracking. Customization is possible to fulfill individual customer request.
Wafer Analysis
Calculate test result summary by zone specified by user, and analysis Yield or Bin in different zone. User can define zone area by interactive interface.
Shmoo History
Store Shmoo data for each device for future use, and show Shmoo detail and diagram for further analysis to reduce the error of manual judgment.
Variance Detection
Grouping and analyzing different Lots by user needs. Analyzing different device and test program by customer’s purpose to easily find out difference between lots and test programs.
